Title :
Continuing radiation evaluation of commercial-off-the-shelf devices for space applications
Author :
Gorelick, J.L. ; McClure, S.S.
Author_Institution :
Hughes Space & Commun. Co., Los Angeles, CA, USA
Abstract :
Radiation test results are presented for a number of commercial transistors and integrated circuits procured in both ceramic and plastic packages. This is part of an ongoing evaluation of the suitability of commercial-off-the-shelf devices for space applications
Keywords :
ceramic packaging; integrated circuit packaging; integrated circuit testing; plastic packaging; radiation effects; space vehicle electronics; ceramic packages; commercial transistors; commercial-off-the-shelf devices; continuing radiation evaluation; integrated circuits; plastic package; radiation test results; space applications; Analog integrated circuits; Circuit testing; Degradation; EPROM; Integrated circuit testing; MOSFETs; Manufacturing; Plastic integrated circuit packaging; Plastic packaging; Propulsion;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896261
