Title :
Design and test of VLSI circuits: a Eurochip perspective
Author_Institution :
Sch. of Eng., Exeter Univ., UK
Abstract :
Provides a Eurochip perspective on the design and test of VLSI circuits. It focuses on: the need to link the design of digital or analogue devices to a degree of self test; the importance of routes to silicon through Eurochip; and the need for adequate fault simulation software to amalgamate self-test on a chip
Keywords :
VLSI; application specific integrated circuits; built-in self test; integrated circuit testing; Eurochip; VLSI circuits; analogue devices; digital devices; fault simulation software; self test; test;
Conference_Titel :
Eurochip Project - VLSI Design in Higher Education, IEE Colloquium on
Conference_Location :
London
