Title :
Fault tolerant tree using adaptive operational redundancy
Author :
Mori, Hideki ; Kambara, Junichi
Author_Institution :
Dept. of Inf. & Comput. Sci., Toyo Univ., Kawagoe, Japan
Abstract :
The authors describe the architecture of fault-tolerant trees. This fault tolerant architecture is based on a majority decision of redundant operations. It shows that low-area redundancy and dynamic fault recovery are possible. This fault tolerant architecture is suitable for binary trees. Two basic types of fault tolerant architecture are presented: clustered architecture by a node-oriented approach and pipeline architecture by a branch-oriented approach
Keywords :
VLSI; fault tolerant computing; parallel architectures; redundancy; trees (mathematics); WSI; adaptive operational redundancy; binary trees; branch-oriented approach; clustered architecture; dynamic fault recovery; fault tolerant architecture; fault-tolerant trees; low-area redundancy; majority decision; node-oriented approach; pipeline architecture; reconfigurable arrays; wafer scale integration; Binary trees; Computer architecture; Fault detection; Fault tolerance; Manufacturing; Parallel processing; Pipelines; Redundancy; Runtime; Voting;
Conference_Titel :
Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-2482-5
DOI :
10.1109/ICWSI.1992.171799