Title :
Single event upset characterization of the Pentium(R) MMX and Celeron(R) microprocessors using proton irradiation
Author :
Hiemstra, David M. ; Baril, Allan
Author_Institution :
MacDonald Dettwiler, Space & Adv. Robotics Ltd., Brampton, Ont., Canada
Abstract :
Experimental single event upset characterization of the Pentium(R) MMX and Celeron(R) microprocessors using proton irradiation is presented. Results are compared with previous testing on the Pentium(R) MMX and Pentium(R) II microprocessors
Keywords :
microprocessor chips; proton effects; Celeron; Pentium MMX; microprocessor; proton irradiation; single event upset; CMOS process; Energy states; Error correction codes; Manufacturing processes; Microprocessors; Packaging; Protons; Single event upset; Space shuttles; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896267
