• DocumentCode
    2788735
  • Title

    Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

  • Author

    Koga, R. ; Crain, S.H. ; Crawford, K.B. ; Moss, S.C. ; LaLumondiere, S.D. ; Howard, J.W., Jr.

  • Author_Institution
    Aerosp. Corp., Los Angeles, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    53
  • Lastpage
    60
  • Abstract
    The single event transient (SET) sensitivity of a radiation hardened voltage comparator type with vertical input transistors is compared with that observed for a COTS device type made up of lateral transistors. The cause of the difference in sensitivity is investigated
  • Keywords
    comparators (circuits); radiation hardening (electronics); COTS voltage comparator; lateral transistor; radiation hardening; single event transient sensitivity; vertical transistor; Circuit testing; Instruments; Operational amplifiers; Radiation hardening; Semiconductor diodes; Silicon on insulator technology; Single event upset; Space vector pulse width modulation; Telephony; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2000
  • Conference_Location
    Reno, NV
  • Print_ISBN
    0-7803-6474-0
  • Type

    conf

  • DOI
    10.1109/REDW.2000.896269
  • Filename
    896269
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2788735