DocumentCode :
2788807
Title :
Wideband wafer-scale interconnections in a wafer scale hybrid package for a 1000 MIPS highly pipelined GaAs/AlGaAs HBT RISC
Author :
Philhower, R. ; Van Etten, J.S. ; Dabral, S. ; Nah, K. ; Greub, H. ; McDonald, J.F.
Author_Institution :
Center for Integrated Electron., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
1992
fDate :
22-24 Jan 1992
Firstpage :
145
Lastpage :
154
Abstract :
A wideband thin-film wafer scale hybrid package (WSHP) or multi-chip module (MCM) will be used to interconnect the chips of a high-performance RISC (reduced instruction set computer) architecture developed at Rensselaer. This architecture is being implemented using GaAs/AlGaAs heterojunction bipolar transistors (HBTs) and triple-level differential current-mode logic. Because of high power consumption yield limitations of the HBT technology, the processor is partitioned into multiple chips. These chips must be connected using lines capable of handling the fast rise-time signals. Also, the MCM must contain integrated bypass capacitors and termination resistors
Keywords :
III-V semiconductors; VLSI; aluminium compounds; bipolar integrated circuits; gallium arsenide; heterojunction bipolar transistors; hybrid integrated circuits; metallisation; packaging; pipeline processing; reduced instruction set computing; thin film circuits; 1000 MIPS; GaAs-AlGaAs; HBT technology; HBTs; MCM; RISC; WSHP; fast rise-time signals; flip chips; heterojunction bipolar transistors; integrated bypass capacitors; multi-chip module; multichip modules; multiple chips; power consumption; reduced instruction set computer; semiconductor; termination resistors; triple-level differential current-mode logic; wafer scale hybrid package; wafer-scale interconnections; wideband interconnects; yield limitations; Capacitors; Chip scale packaging; Computer aided instruction; Computer architecture; Energy consumption; Gallium arsenide; Heterojunction bipolar transistors; Logic; Reduced instruction set computing; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-2482-5
Type :
conf
DOI :
10.1109/ICWSI.1992.171805
Filename :
171805
Link To Document :
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