• DocumentCode
    2788852
  • Title

    High density metal cross-point laser linking

  • Author

    Bernstein, Joseph B. ; Gleason, Edward F. ; Wyatt, Peter W.

  • Author_Institution
    MIT Lincoln Lab., Lexington, MA, USA
  • fYear
    1992
  • fDate
    22-24 Jan 1992
  • Firstpage
    176
  • Lastpage
    181
  • Abstract
    Laser-programmed inter-level metal connections have been developed as a means of achieving high-density linking for additive redundancy in restructurable logic and in wafer scale integration. The authors report on the successful linking of 8×8 cross-points of aluminium alloy lines separated by SiNx insulation. Both processing and linking issues are addressed. The processing issues are extensions of the problems associated with any reliable two-level metal process with the added concerns of making structures for laser linking. The linking issues involve aiming a laser and forming a link with minimum peripheral damage to either the connecting metal lines or the underlying oxide and silicon
  • Keywords
    VLSI; aluminium alloys; laser beam applications; metallisation; redundancy; 8*8 cross-points; Al alloy; WSI; additive redundancy; connecting metal lines; cross-point laser linking; high-density linking; inter-level metal connections; linking issues; minimum peripheral damage; processing issues; restructurable logic; wafer scale integration; Aluminum alloys; Etching; Insulation; Joining processes; Laser beam cutting; Logic arrays; Metal-insulator structures; Silicon compounds; Surfaces; Wafer scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-2482-5
  • Type

    conf

  • DOI
    10.1109/ICWSI.1992.171809
  • Filename
    171809