DocumentCode
2788865
Title
Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor
Author
Crain, Susan H. ; La Lumondiere, Stephen D. ; Miller, Stephen W. ; Crain, William R. ; Crawford, Kirk B. ; Hansel, Steven J. ; Koga, R. ; Moss, Steven C.
Author_Institution
Aerosp. Corp., El Segundo, CA, USA
fYear
2000
fDate
2000
Firstpage
85
Lastpage
88
Abstract
It has been observed that the 68302 microprocessor, which is being flown on several space vehicles, has not shown signs of experiencing either single event latchup (SEL) or single event snapback (SES) as would have been predicted using ground-based test data. This study presents the comparison of the flight to ground data
Keywords
ion beam effects; microprocessor chips; space vehicle electronics; 68302 microprocessor; flight test; ground test; heavy ion irradiation; high current state; single event latchup; single event snapback; space vehicle; Aerospace testing; Argon; Artificial satellites; Circuit testing; Helium; Kirk field collapse effect; Microprocessors; Single event upset; Space vehicles; Telephony;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2000
Conference_Location
Reno, NV
Print_ISBN
0-7803-6474-0
Type
conf
DOI
10.1109/REDW.2000.896275
Filename
896275
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