Title :
EXEQ I-IV: SEE in-flight measurement on the MIR orbital station
Author :
Falguere, D. ; Duzellier, Sophie ; Ecoffet, Robert ; Tsourilo, Igor
Author_Institution :
ONERA-DESP, Toulouse, France
Abstract :
SEE spaceflight measurements are presented on various devices (SRAMs and DRAMs) in the MIR orbital station. The standard models CREAME and AP8 have been used to predict the event rates from heavy ion and proton ground data. The prediction and actual in-flight rates are compared
Keywords :
DRAM chips; SRAM chips; ion beam effects; proton effects; space vehicle electronics; AP8 model; CREAME model; DRAM; EXEQ; MIR orbital station; SEE; SRAM; heavy ion irradiation; in-flight measurement; proton irradiation; Extraterrestrial measurements; Microprocessors; Predictive models; Protons; Random access memory; Space missions; Space stations; Space technology; Telephony; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896276
