• DocumentCode
    2788889
  • Title

    EXEQ I-IV: SEE in-flight measurement on the MIR orbital station

  • Author

    Falguere, D. ; Duzellier, Sophie ; Ecoffet, Robert ; Tsourilo, Igor

  • Author_Institution
    ONERA-DESP, Toulouse, France
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    89
  • Lastpage
    95
  • Abstract
    SEE spaceflight measurements are presented on various devices (SRAMs and DRAMs) in the MIR orbital station. The standard models CREAME and AP8 have been used to predict the event rates from heavy ion and proton ground data. The prediction and actual in-flight rates are compared
  • Keywords
    DRAM chips; SRAM chips; ion beam effects; proton effects; space vehicle electronics; AP8 model; CREAME model; DRAM; EXEQ; MIR orbital station; SEE; SRAM; heavy ion irradiation; in-flight measurement; proton irradiation; Extraterrestrial measurements; Microprocessors; Predictive models; Protons; Random access memory; Space missions; Space stations; Space technology; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2000
  • Conference_Location
    Reno, NV
  • Print_ISBN
    0-7803-6474-0
  • Type

    conf

  • DOI
    10.1109/REDW.2000.896276
  • Filename
    896276
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2788889