• DocumentCode
    2788933
  • Title

    Dose rate and bias dependency of total dose sensitivity of low dropout voltage regulators

  • Author

    McClure, Steven S. ; Gorelick, Jerry L. ; Pease, Ron ; Johnston, Allan H.

  • Author_Institution
    Hughes Space & Commun. Co., El Segundo, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    100
  • Lastpage
    105
  • Abstract
    Total dose tests of six different low dropout voltage regulators show sensitivity to both dose rate and bias during exposure. All devices tested exhibited Enhanced Low Dose Rate Sensitivity (ELDRS) and performed worse for the unbiased irradiation condition. Behavior of critical parameters in different dose rate and bias conditions is compared and the impact on hardness assurance methodology is discussed
  • Keywords
    integrated circuit testing; power integrated circuits; radiation effects; radiation hardening (electronics); space vehicle electronics; voltage regulators; Enhanced Low Dose Rate Sensitivity; bias dependency; critical parameters; dose rate; hardness assurance methodology; low dropout voltage regulators; total dose sensitivity; unbiased irradiation condition; Costs; Degradation; Ionizing radiation; Laboratories; Low voltage; Performance evaluation; Propulsion; Regulators; Telephony; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2000
  • Conference_Location
    Reno, NV
  • Print_ISBN
    0-7803-6474-0
  • Type

    conf

  • DOI
    10.1109/REDW.2000.896278
  • Filename
    896278
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2788933