Title :
Radiation damage and single event effect results for candidate spacecraft electronics
Author :
Bryan, Martha V O´ ; LaBel, Kenneth A. ; Reed, Robert A. ; Howard, James W., Jr. ; Ladbury, Ray L. ; Barth, Janet L. ; Kniffin, Scott D. ; Seidleck, Christina M. ; Marshall, Paul W. ; Marshall, Cheryl J. ; Kim, Hak S. ; Hawkins, Donald K. ; Sanders, Antho
Author_Institution :
Raytheon Inf. Technol. & Sci. Services, Lanham, MD, USA
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. We also present data on the susceptibility of parts to functional degradation resulting from total ionizing dose at low dose rates (0.003-4.52 rads(Si)/s). Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others
Keywords :
analogue integrated circuits; analogue-digital conversion; digital integrated circuits; digital-analogue conversion; integrated circuit reliability; integrated circuit testing; ion beam effects; monolithic integrated circuits; optoelectronic devices; proton effects; space vehicle electronics; ADC; DAC; DC-DC converters; SEE testing; SEU; analog devices; analog/digital converters; digital devices; digital/analog converters; functional degradation; heavy-ion induced SEE; hybrid devices; linear bipolar devices; low dose rates; optoelectronics; proton induced SEE; proton-induced damage; radiation damage; radiation vulnerability; single event effect; spacecraft electronics; total ionizing dose; Aerospace electronics; Analog-digital conversion; Laboratories; Performance evaluation; Physics; Protons; Single event upset; Space technology; Space vehicles; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896279
