• DocumentCode
    2788972
  • Title

    A compendium of recent optocoupler radiation test data

  • Author

    LaBel, K.A. ; Kniffin, S.D. ; Reed, R.A. ; Kim, H.S. ; Wert, J.L. ; Oberg, D.L. ; Normand, E. ; Johnston, A.H. ; Lum, G.K. ; Koga, R. ; Crain, S. ; Schwank, J.R. ; Hash, G.L. ; Buchner, S. ; Mann, J. ; Simpkins, L. ; D´Ordine, M. ; Marshall, C.A. ; O´Brya

  • Author_Institution
    NASA Goddard Space Flight Center, USA
  • fYear
    2000
  • fDate
    24-28 July 2000
  • Firstpage
    123
  • Lastpage
    146
  • Abstract
    We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients (SET) and degradation due to total ionizing dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.
  • Keywords
    ion beam effects; neutron effects; opto-isolators; proton effects; semiconductor device testing; space vehicle electronics; heavy ion displacement damage; ionizing damage mechanisms; neutron displacement damage; nonionizing damage mechanisms; optocoupler; proton displacement damage; radiation test data; single event transients; total ionizing dose; Aerospace electronics; Aerospace engineering; Aerospace testing; Degradation; Ionizing radiation; Laboratories; Light emitting diodes; Neutrons; Protons; Space technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2000
  • Conference_Location
    Reno, NV, USA
  • Print_ISBN
    0-7803-6474-0
  • Type

    conf

  • DOI
    10.1109/REDW.2000.896280
  • Filename
    896280
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2788972