Author :
LaBel, K.A. ; Kniffin, S.D. ; Reed, R.A. ; Kim, H.S. ; Wert, J.L. ; Oberg, D.L. ; Normand, E. ; Johnston, A.H. ; Lum, G.K. ; Koga, R. ; Crain, S. ; Schwank, J.R. ; Hash, G.L. ; Buchner, S. ; Mann, J. ; Simpkins, L. ; D´Ordine, M. ; Marshall, C.A. ; O´Brya
Abstract :
We present a compendium of optocoupler radiation test data including data on neutron, proton and heavy ion displacement damage (DD), single event transients (SET) and degradation due to total ionizing dose (TID). Proton data includes ionizing and non-ionizing damage mechanisms.
Keywords :
ion beam effects; neutron effects; opto-isolators; proton effects; semiconductor device testing; space vehicle electronics; heavy ion displacement damage; ionizing damage mechanisms; neutron displacement damage; nonionizing damage mechanisms; optocoupler; proton displacement damage; radiation test data; single event transients; total ionizing dose; Aerospace electronics; Aerospace engineering; Aerospace testing; Degradation; Ionizing radiation; Laboratories; Light emitting diodes; Neutrons; Protons; Space technology;
