• DocumentCode
    2789085
  • Title

    A wafer scale dynamic thermal scene generator

  • Author

    Chapman, G.H. ; Parameswaran, M. ; Syrzycki, M.J.

  • Author_Institution
    Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
  • fYear
    1992
  • fDate
    22-24 Jan 1992
  • Firstpage
    300
  • Lastpage
    309
  • Abstract
    As a prototype WSTA (wafer scale transducer array), a wafer scale dynamic thermal scene generator is being developed to generate a controllable infrared (IR) image for use in calibrating IR detector arrays. The basic array consists of two cell types, one being a thermal pixel containing a poly Si resistor sitting on a suspended oxide bridge. The second cell contains the addressing, intensity register, and current level control electronics. Unlike digital WSI designs, WSTA redundancy efforts must emphasize local over global transducer sparing even considering cluster effects. Granularity in transducer location drives local pixel cells into creating small subtransducer arrays, with multiple devices at each site turned on for a single pixel. The control cells are allowed a larger substitution area than the thermal transducer
  • Keywords
    VLSI; image sensors; infrared imaging; IR detector arrays; WSTA; cell types; cluster effects; current level control electronics; dynamic thermal scene generator; intensity register; multiple devices; pixel cells; polysilicon resistor; subtransducer arrays; suspended oxide bridge; thermal pixel; transducer location; wafer scale; Bridges; Infrared detectors; Infrared imaging; Layout; Level control; Prototypes; Resistors; Sensor arrays; Thermal resistance; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    0-8186-2482-5
  • Type

    conf

  • DOI
    10.1109/ICWSI.1992.171822
  • Filename
    171822