DocumentCode
2789085
Title
A wafer scale dynamic thermal scene generator
Author
Chapman, G.H. ; Parameswaran, M. ; Syrzycki, M.J.
Author_Institution
Sch. of Eng. Sci., Simon Fraser Univ., Burnaby, BC, Canada
fYear
1992
fDate
22-24 Jan 1992
Firstpage
300
Lastpage
309
Abstract
As a prototype WSTA (wafer scale transducer array), a wafer scale dynamic thermal scene generator is being developed to generate a controllable infrared (IR) image for use in calibrating IR detector arrays. The basic array consists of two cell types, one being a thermal pixel containing a poly Si resistor sitting on a suspended oxide bridge. The second cell contains the addressing, intensity register, and current level control electronics. Unlike digital WSI designs, WSTA redundancy efforts must emphasize local over global transducer sparing even considering cluster effects. Granularity in transducer location drives local pixel cells into creating small subtransducer arrays, with multiple devices at each site turned on for a single pixel. The control cells are allowed a larger substitution area than the thermal transducer
Keywords
VLSI; image sensors; infrared imaging; IR detector arrays; WSTA; cell types; cluster effects; current level control electronics; dynamic thermal scene generator; intensity register; multiple devices; pixel cells; polysilicon resistor; subtransducer arrays; suspended oxide bridge; thermal pixel; transducer location; wafer scale; Bridges; Infrared detectors; Infrared imaging; Layout; Level control; Prototypes; Resistors; Sensor arrays; Thermal resistance; Transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
Conference_Location
San Francisco, CA
Print_ISBN
0-8186-2482-5
Type
conf
DOI
10.1109/ICWSI.1992.171822
Filename
171822
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