The influence of the distributed trapped charge on VFTO

Author

Yu, Hongyang ; Lu, Binxian

Author_Institution

Sch. of Electr. & Electron. Eng., North China Electr. Power Univ., Beijing, China

fYear

2010

fDate

20-22 Sept. 2010

Firstpage

1

Lastpage

4

Abstract

In this paper, the nodal admittance equation is derived for analyzing the response of the transmission line under the residual voltage due to uniformly distributed charge along the line in Laplace domain. We equivalent the trapped charge to the current sources which are located at near-end and far-end when the disconnector switching is operated. Based on the Numerical Inverse Laplace Transform method, the response of the transmission line is solved. And the simulation results are compared with the simulations in EMTP to confirm that the formulation is correct. Based on the equation presented in this paper, several simulations have been studied. We simulate the effect of trapped charge with different magnitude on VFTO, and the effect of length of line on VFTO.

Keywords

EMTP; Laplace transforms; electric admittance; overvoltage; power transmission lines; EMTP; Laplace domain; VFTO; current source; distributed trapped charge; inverse Laplace transform method; nodal admittance equation; residual voltage; transmission line; very fast transient overvoltage; EMTP; Equations; Equivalent circuits; Mathematical model; Numerical models; Power transmission lines; GIS; VFTO; transmission line; trapped charge;

fLanguage

English

Publisher

ieee

Conference_Titel

Critical Infrastructure (CRIS), 2010 5th International Conference on

Conference_Location

Beijing

Print_ISBN

978-1-4244-8080-7

Type

conf

DOI

10.1109/CRIS.2010.5617488

Filename

5617488