• DocumentCode
    2789237
  • Title

    Toward robust learning of the Gaussian mixture state emission densities for hidden Markov models

  • Author

    Tang, Hao ; Hasegawa-Johnson, Mark ; Huang, Thomas S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
  • fYear
    2010
  • fDate
    14-19 March 2010
  • Firstpage
    5242
  • Lastpage
    5245
  • Abstract
    One important class of state emission densities of the hiddenMarkov model (HMM) is the Gaussian mixture densities. The classical Baum-Welch algorithm often fails to reliably learn the Gaussian mixture densities when there is insufficient training data, due to the large number of free parameters present in the model. In this paper, we propose a novel strategy for robustly and accurately learning the Gaussian mixture state emission densities of the HMM. The strategy is based on an ensemble framework for probability density estimation in which the learning of the Gaussian mixture densities is formulated as a gradient descent search in a function space. The resulting learning algorithm is called “the boosting Baum-Welch algorithm.” Our preliminary experiment results on emotion recognition from speech show that the proposed algorithm outperforms the original Baum-Welch algorithm on this task.
  • Keywords
    Gaussian processes; emotion recognition; gradient methods; hidden Markov models; learning (artificial intelligence); speech recognition; Gaussian mixture state emission density; boosting Baum-Welch algorithm; ensemble learning; gradient descent search; hidden Markov models; probability density estimation; speech emotion recognition; Boosting; Emotion recognition; Hidden Markov models; Parameter estimation; Random processes; Robustness; Sequences; Speech; Stochastic processes; Training data; Baum-Welch algorithm; Gaussian mixture density; boosting; hidden Markov model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
  • Conference_Location
    Dallas, TX
  • ISSN
    1520-6149
  • Print_ISBN
    978-1-4244-4295-9
  • Electronic_ISBN
    1520-6149
  • Type

    conf

  • DOI
    10.1109/ICASSP.2010.5494989
  • Filename
    5494989