DocumentCode :
2789246
Title :
Miss Ratio Improvement For Real-Time Applications Using Fragmentation-Aware Placement
Author :
ElFarag, Ahmed Abou ; El-Boghdadi, Hatem M. ; Shaheen, Samir I.
Author_Institution :
Dept. of Comput. Eng., Cairo Univ., Giza
fYear :
2007
fDate :
26-30 March 2007
Firstpage :
1
Lastpage :
8
Abstract :
Partially reconfigurable field-programmable gate arrays (FPGAs) allow parts of the chip to be configured at run-time where each part could hold an independent task. Online placement of these tasks result in area fragmentation leading to poor utilization of chip resources. In this paper, we propose a new metric for measuring area fragmentation. The new fragmentation metric gives an indication to the continuity of the occupied (or free) space and not the amount of occupied space. We show how this metric can be extended for multi-dimensional structures. We also show how this metric can be computed efficiently at run time. Next we use this measure during online placement of tasks on FPGAs, such that the chip fragmentation is reduced. Our results show improvement of chip utilization when using this fragmentation aware placement method over other placement methods with well known bottom left first fit, and best fit placement strategies. In real time environment, we achieve an improvement in miss ratio when using the fragmentation aware placement over the bottom left placement strategy.
Keywords :
field programmable gate arrays; microprocessor chips; real-time systems; reconfigurable architectures; FPGA; best fit placement method; bottom left first fit mehod; chip fragmentation; framentation-aware placement method; miss ratio improvement; partially reconfigurable field-programmable gate arrays; real-time applications; Application software; Area measurement; Extraterrestrial measurements; Fabrics; Field programmable gate arrays; Monitoring; Real time systems; Runtime; Scattering; Semiconductor device measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel and Distributed Processing Symposium, 2007. IPDPS 2007. IEEE International
Conference_Location :
Long Beach, CA
Print_ISBN :
1-4244-0910-1
Electronic_ISBN :
1-4244-0910-1
Type :
conf
DOI :
10.1109/IPDPS.2007.370386
Filename :
4228114
Link To Document :
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