DocumentCode :
2789366
Title :
GUI Software Fault Localization Using N-gram Analysis
Author :
Yu, Zhongxing ; Hu, Hai ; Bai, Chenggang ; Cai, Kai-Yuan ; Wong, W. Eric
Author_Institution :
Dept. of Autom. Control, Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
fYear :
2011
fDate :
10-12 Nov. 2011
Firstpage :
325
Lastpage :
332
Abstract :
Graphical User Interfaces (GUIs) have become an important and accepted way of interacting with today´s software. Fault localization is considered to be one of the most expensive program debugging activities. This paper presents a fault localization technique designed for GUI software. Unlike traditional software, GUI test cases usually are event sequences and each individual event has a unique corresponding event handler. We apply data mining techniques to the event sequences and their output data in terms of failure detections collected in the testing phase to rank the fault proneness of the event handlers for fault localization. Our method applies N-gram analysis to rank the event handlers of GUI programs and data collected from case studies on four real life GUI programs demonstrate the effectiveness of the proposed technique.
Keywords :
data mining; graphical user interfaces; software fault tolerance; GUI software fault localization; N-gram analysis; data mining technique; event handler; event sequence; graphical user interface; Association rules; Graphical user interfaces; Itemsets; Software; Software algorithms; Testing; GUIs; N-gram analysis; event handler; event sequences; fault localization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Assurance Systems Engineering (HASE), 2011 IEEE 13th International Symposium on
Conference_Location :
Boca Raton, FL
ISSN :
1530-2059
Print_ISBN :
978-1-4673-0107-7
Type :
conf
DOI :
10.1109/HASE.2011.29
Filename :
6113915
Link To Document :
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