DocumentCode :
2789761
Title :
Eddy current testing in thickness measurement of material with multi-layer structure
Author :
Chen, Peihua ; Huang, Pingjie ; Li, Guohou ; Cai, Wen ; Zhou, Zekui
Author_Institution :
Dept. of Control Sci. & Eng., Zhejiang Univ., Hangzhou, China
fYear :
2009
fDate :
17-19 June 2009
Firstpage :
2065
Lastpage :
2068
Abstract :
The fundamental law of the variation of the probe´s impedance in thickness measurement of layer structure material using eddy current sensors including the liftoff phenomena has been found that is the variation of the conductivity of the material which is nearest to the probe of the sample with certain thickness has the critical effect in the induced variation of the probe´s impedance in eddy current testing at multilayer material. Therewith the paper prove it by the operation results of the analytical model of multilayer structure in eddy current testing. And accordingly it explains different appearances of experiments well in multilayer material eddy current testing.
Keywords :
eddy current testing; materials handling; thickness control; thickness measurement; eddy current testing; liftoff phenomena; material conductivity variation; material thickness measurement; multilayer structure material; Analytical models; Conducting materials; Conductivity; Eddy current testing; Eddy currents; Impedance; Nonhomogeneous media; Probes; Sensor phenomena and characterization; Thickness measurement; eddy current; multi-layer structure; thickness measuring; variation in conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Decision Conference, 2009. CCDC '09. Chinese
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-2722-2
Electronic_ISBN :
978-1-4244-2723-9
Type :
conf
DOI :
10.1109/CCDC.2009.5192278
Filename :
5192278
Link To Document :
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