DocumentCode
2790954
Title
Sub-quarter micron gate length high electron mobility transistors processing technology
Author
Ynag, Y.
Author_Institution
Academia Sinica
fYear
1989
fDate
0-0 1989
Firstpage
532
Lastpage
535
Abstract
This paper describes the design principle of modulation doped AlGaAs/GaAs field effect transistors (HEMT). Processing steps of gate length as short as 0. 2 /spl mu/m with T-shape gate and the condition of the E-Beam lithography to obtain submicron gate length. Transcanductances of the order of 200ms/mm at room temperature and 375ms/mm at 77K are measured.
Keywords
Buffer layers; Doping; Electrons; Epitaxial layers; Gallium arsenide; HEMTs; Impurities; MODFETs; Scattering; Transconductance;
fLanguage
English
Publisher
ieee
Conference_Titel
Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
Conference_Location
Beijing, China
Print_ISBN
0-87942-717-5
Type
conf
DOI
10.1109/ICMWFT.1989.763898
Filename
763898
Link To Document