• DocumentCode
    2790954
  • Title

    Sub-quarter micron gate length high electron mobility transistors processing technology

  • Author

    Ynag, Y.

  • Author_Institution
    Academia Sinica
  • fYear
    1989
  • fDate
    0-0 1989
  • Firstpage
    532
  • Lastpage
    535
  • Abstract
    This paper describes the design principle of modulation doped AlGaAs/GaAs field effect transistors (HEMT). Processing steps of gate length as short as 0. 2 /spl mu/m with T-shape gate and the condition of the E-Beam lithography to obtain submicron gate length. Transcanductances of the order of 200ms/mm at room temperature and 375ms/mm at 77K are measured.
  • Keywords
    Buffer layers; Doping; Electrons; Epitaxial layers; Gallium arsenide; HEMTs; Impurities; MODFETs; Scattering; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
  • Conference_Location
    Beijing, China
  • Print_ISBN
    0-87942-717-5
  • Type

    conf

  • DOI
    10.1109/ICMWFT.1989.763898
  • Filename
    763898