DocumentCode :
2791230
Title :
Hierarchical interconnect circuit models
Author :
Beattie, M. ; Gupta, S. ; Pileggi, L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
fYear :
2000
fDate :
5-9 Nov. 2000
Firstpage :
215
Lastpage :
221
Abstract :
The increasing size of integrated systems combined with deep submicron physical modeling details creates an explosion in RLC interconnect modeling complexity of unmanageable proportions. Interconnect extraction tools employ hierarchy to manage complexity, but this hierarchy is discarded via eliminating far away coupling terms when the equivalent ARC circuits are Formed. The increasing dominance of capacitance coupling along with the emergence of on chip inductance, however, makes the composite effect of far-away couplings increasingly evident. Even if newly enforced design rules and practices will ultimately obviate the need for modeling these couplings for design verification, some approximation of the "exact" solution is required to validate these rules. This paper proposes an efficient hierarchical equivalent circuit representation of interconnect parasitics that utilizes the efficient hierarchical long-distance modeling already existing within extractors. Results from a prototype simulator based on these hierarchical models demonstrate the simulation inaccuracy incurred when the faraway coupling terms are ignored. Such a form of interconnect modeling may provide the key to hierarchical modeling of electro-magnetic interactions between large components on future gigascale systems.
Keywords :
circuit complexity; circuit layout CAD; RLC interconnect modeling; capacitance coupling; deep submicron physical modeling; design verification; hierarchical equivalent circuit representation; hierarchical interconnect circuit models; hierarchical modeling; interconnect parasitics; Capacitance; Circuit simulation; Coupling circuits; Disaster management; Equivalent circuits; Explosions; Inductance; Integrated circuit interconnections; RLC circuits; Virtual prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
ISSN :
1092-3152
Print_ISBN :
0-7803-6445-7
Type :
conf
DOI :
10.1109/ICCAD.2000.896477
Filename :
896477
Link To Document :
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