DocumentCode :
2791570
Title :
Technology-circuit co-design of asymmetric SRAM cells for read stability improvement
Author :
Kim, Jae-Joon ; Rao, Rahul ; Kim, Keunwoo
Author_Institution :
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear :
2010
fDate :
19-22 Sept. 2010
Firstpage :
1
Lastpage :
4
Abstract :
We present asymmetric SRAM cell design approaches to improve Read stability over conventional symmetric SRAM Cell. We show that selective threshold voltage control is more effective than adjusting transistor size for read stability improvement in an asymmetric SRAM cell. We implement statistical DC noise margin monitors and present the hardware measurement data as well as the DC/AC simulation data to support the claims.
Keywords :
integrated circuit design; random-access storage; asymmetric SRAM cell design; asymmetric SRAM cells; read stability improvement; selective threshold voltage control; statistical DC noise margin monitors; symmetric SRAM Cell; technology-circuit co-design; transistor size; Circuit stability; Monte Carlo methods; Noise; Random access memory; Simulation; Stability analysis; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2010 IEEE
Conference_Location :
San Jose, CA
ISSN :
0886-5930
Print_ISBN :
978-1-4244-5758-8
Type :
conf
DOI :
10.1109/CICC.2010.5617632
Filename :
5617632
Link To Document :
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