DocumentCode
2791813
Title
Automated statistical process control systems (ASPCS)
Author
Palanki, H.R.
Author_Institution
IBM Corp., San Jose, CA, USA
fYear
1990
fDate
1-3 Oct 1990
Firstpage
204
Lastpage
207
Abstract
Describes eight steps necessary to automate statistical quality control for a manufacturing facility. Successful implementation depends mainly on management support and the talent involved. The benefits of this system include improved productivity and self-sufficiency for the operator. The objective can be achieved through the implementation of automated statistical process control systems (ASPCSs) starting from the development through the manufacturing phases of the product. The underlying objective of ASPCSs is to ensure overall process optimization through the real-time identification and removal of causes of defects at the earliest point of the process. This is accomplished by integrating all of the following functions: data automation, database management, problem detection through statistical methods, problem definition through diagnostic methods, and corrective action feedback and follow-up. The author provides the step-by-step procedures for implementing an ASPCS workstation and describes the demonstration of these functions in manufacturing applications
Keywords
database management systems; quality control; statistical process control; automated statistical process control systems; corrective action feedback; data automation; database management; management; manufacturing facility; problem detection; process optimization; productivity; real-time identification; self-sufficiency; statistical quality control; workstation; Databases; Feedback; Manufacturing automation; Manufacturing processes; Process control; Production facilities; Productivity; Quality control; Statistical analysis; Workstations;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1990 Proceedings, Competitive Manufacturing for the Next Decade. IEMT Symposium, Ninth IEEE/CHMT International
Conference_Location
Washington, DC
Type
conf
DOI
10.1109/IEMT9.1990.115007
Filename
115007
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