• DocumentCode
    2791822
  • Title

    Regularity driven logic synthesis

  • Author

    Kutzschebauch, T. ; Stok, L.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • fYear
    2000
  • fDate
    5-9 Nov. 2000
  • Firstpage
    439
  • Lastpage
    446
  • Abstract
    We present a new and innovative logic synthesis approach using regularity information of a design to selectively apply transformations and globally guide the synthesis process. Since traditional logic synthesis applies transformations without consideration of global design characteristics such as regularity and dataflow, it destroys a substantial amount of regular structures. In addition, due to the non-incremental nature of most logic transformations, synthesis relies vastly on the computationally expensive concept of trial and error application of transformations, a time-consuming process in the synthesis of large designs. The proposed approach addresses both shortcomings of traditional logic synthesis and describes a mechanism to speed up logic synthesis and preserve regularity. It selectively applies transformations to places with similar characteristics and to the same stage of a regular structure, introducing a notion of dataflow-aware synthesis. Preservation of regular structures has tremendous advantages to the following physical design stages. It yields high-density layouts, shorter wiring length and improved delay. In addition, the layout becomes more predictable at an earlier design stage.
  • Keywords
    data flow computing; logic CAD; dataflow; dataflow-aware synthesis; delay; high-density layouts; logic synthesis; regularity; regularity information; shorter wiring; transformations; Delay; Design automation; Design optimization; Electronic design automation and methodology; Fabrication; Logic design; Microelectronics; Minimization; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-6445-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.2000.896511
  • Filename
    896511