• DocumentCode
    2791824
  • Title

    Influence Of Phase-to-phase Memory Propagation On The Stochastic Behavior of Ac-generated Partial Discharges

  • Author

    Van Brunt, R.J. ; Cernyar, E.W.

  • Author_Institution
    National Institute of Standards and Technology
  • fYear
    1991
  • fDate
    1991
  • Firstpage
    589
  • Lastpage
    596
  • Keywords
    Data mining; Dielectric measurements; Electrodes; NIST; Partial discharges; Phase measurement; Pulse measurements; Stochastic processes; Surface charging; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1991. CEIDP. 1991 Annual Report. Conference on
  • Type

    conf

  • DOI
    10.1109/CEIDP.1991.763954
  • Filename
    763954
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2791824