Title :
Influence Of Phase-to-phase Memory Propagation On The Stochastic Behavior of Ac-generated Partial Discharges
Author :
Van Brunt, R.J. ; Cernyar, E.W.
Author_Institution :
National Institute of Standards and Technology
Keywords :
Data mining; Dielectric measurements; Electrodes; NIST; Partial discharges; Phase measurement; Pulse measurements; Stochastic processes; Surface charging; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1991. CEIDP. 1991 Annual Report. Conference on
DOI :
10.1109/CEIDP.1991.763954
