• DocumentCode
    2792360
  • Title

    Breakdown of a thin dielectric liquid layer and interfacial phenomena

  • Author

    Brosseau, Christian

  • Author_Institution
    Lab. de Spectrometrie Phys., Univ. Joseph Fourier, St. Martin d´´Heres, France
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    257
  • Abstract
    The author describes measurements of electrical breakdown on thin liquid dielectric (capacitor impregnant) layers for different interfacial situations. The dielectric strength depends on various factors such as electrode area, gap spacing, the nature of the interface in contact with the liquid, and temperature. The breakdown phenomena are shown to be either connected to high-field conduction-boiling or electrohydrodynamic cavitations leading to the generation of a vapor bubble in the prebreakdown regime-or related to the presence of particles and/or local field enhancements
  • Keywords
    cavitation; dielectric properties of liquids and solutions; electric breakdown of liquids; electric strength; electrohydrodynamics; interface phenomena; all-film capacitors; boiling; capacitor impregnant layers; dielectric strength; electrical breakdown; electrode area; electrohydrodynamic cavitations; gap spacing; high-field conduction; interfacial phenomena; local field enhancements; prebreakdown regime; presence of particles; thin dielectric liquid layer; vapor bubble; Capacitors; Contacts; Dielectric breakdown; Dielectric liquids; Dielectric measurements; Electric breakdown; Electric variables measurement; Electrodes; Electrohydrodynamics; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172046
  • Filename
    172046