• DocumentCode
    2792424
  • Title

    Better-than-Heisenberg scaling of sensitivity with light and cold atomic ensembles

  • Author

    Napolitano, M. ; Behbood, N. ; Ceré, A. ; Dubost, B. ; Koschorreck, M. ; Mitchell, M.W.

  • Author_Institution
    ICFO-Inst. de Cienc. Fotoniques, Barcelona, Spain
  • fYear
    2009
  • fDate
    14-19 June 2009
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This work considers an atom-light interface consisting of pulses of polarized light that interacts with an ensemble of 106 cold 87Rb in dipole trap. Measurements of polarization changes in the light is used in probing the atomic state. In such polarization-based atom-light interface, a Hamiltonian nonlinear in the Stokes operators can be produced through optical nonlinearities. This work investigates the application of light and cold atomic ensembles to precision measurements with better-than-Heisenberg scaling. The effective nonlinear polarizability of atoms due to ns-duration illumination pulses and the resulting polarization rotation are also calculated in detail.
  • Keywords
    atom-photon collisions; laser cooling; light polarisation; nonlinear optics; optical rotation; polarisability; quantum optics; radiation pressure; rubidium; Hamiltonian; Rb; Stokes operators; atom-light interface; atomic state probing; better-than-Heisenberg scaling; cold 87Rb; cold atomic ensembles; dipole trap; light polarization changes; light sensitivity; nanosecond-duration illumination pulses; nonlinear polarizability; optical nonlinearities; polarization rotation; polarized light; precision measurements; Atom optics; Atomic measurements; Interferometry; Optical polarization; Optical pulses; Optical pumping; Parameter estimation; Probes; Pulse measurements; Quantum entanglement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-4079-5
  • Electronic_ISBN
    978-1-4244-4080-1
  • Type

    conf

  • DOI
    10.1109/CLEOE-EQEC.2009.5192425
  • Filename
    5192425