Title :
Detection of reflector surface error from near-field data: Effect of edge diffracted field
Author :
Cherrette, A.R. ; Lee, S.W. ; Acosta, R.
Author_Institution :
Univ. of Illinois at Urbana - Champaign, Urbana, Illinois
Keywords :
Antenna measurements; Apertures; Electromagnetic diffraction; Electromagnetic fields; Equations; Laboratories; Length measurement; NASA; Phase measurement; Reflector antennas;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1987
Conference_Location :
Blacksburg, VA, USA
DOI :
10.1109/APS.1987.1150116