DocumentCode :
2792772
Title :
Classification of Alzheimer´s disease and mild cognitive impairment by pattern recognition of EEG power and coherence
Author :
Akrofi, Kwaku ; Pal, Ranadip ; Baker, Mary C. ; Nutter, Brian S. ; Schiffer, Randolph W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
fYear :
2010
fDate :
14-19 March 2010
Firstpage :
606
Lastpage :
609
Abstract :
This paper describes a methodology used to classify Alzheimer´s disease (AD) and mild cognitive impairment (MCI) with high accuracy using EEG data. The sequential forward floating search (SFFS) was used to select features from relative average power for channel locations in frequency bands delta, theta, alpha, and beta, and coherence between intrahemispheric channel pairs for the same frequency ranges. The selected feature sets allowed us to achieve close to 90% classifier accuracy when classifying MCI patients and normal subjects. Our results showed that selecting features from a combined set of power and coherence features produced better results than the use of either feature independently. The combined feature set also showed better classification rates than a Bayesian classifier fusion approach.
Keywords :
diseases; electroencephalography; feature extraction; medical signal processing; neurophysiology; pattern classification; signal classification; Alzheimer disease; Bayesian classifier fusion approach; EEG; MCI; alpha band; beta band; coherence band; delta band; feature selection; intrahemispheric channel pairs; mild cognitive impairment; pattern recognition; sequential forward floating search; theta band; Aging; Alzheimer´s disease; Bayesian methods; Coherence; Dementia; Electroencephalography; Frequency; Pattern recognition; Power engineering and energy; Power engineering computing; Alzheimer´s disease (AD); Bayesian data fusion; Sequential floating forward search (SFFS); mild cognitive impairment (MCI);
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Acoustics Speech and Signal Processing (ICASSP), 2010 IEEE International Conference on
Conference_Location :
Dallas, TX
ISSN :
1520-6149
Print_ISBN :
978-1-4244-4295-9
Electronic_ISBN :
1520-6149
Type :
conf
DOI :
10.1109/ICASSP.2010.5495193
Filename :
5495193
Link To Document :
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