• DocumentCode
    2793090
  • Title

    Testing of iterative logic arrays

  • Author

    Bhatia, Sandeep ; Albicki, Alexander

  • Author_Institution
    Dept. of Electr. Eng., Rochester Univ., NY, USA
  • fYear
    1990
  • fDate
    12-14 Aug 1990
  • Firstpage
    243
  • Abstract
    A method is presented to identify test vectors for iterative logic arrays (ILA). An ILA consists of several identical cells connected together in a regular configuration. The circuit regularity is exploited to regenerate the test vectors, applied at the boundary cells, within the array and thus propagate the test vectors to the entire array. This facilitates simultaneous testing of the entire circuit. The method covers a wide range of regular array structures like adders, multipliers, and interconnection networks
  • Keywords
    adders; logic arrays; logic testing; multiplying circuits; adders; boundary cells; circuit regularity; interconnection networks; iterative logic arrays; multipliers; test vectors; Adders; Circuit faults; Circuit testing; Equations; Iterative methods; Logic arrays; Logic testing; Multiprocessor interconnection networks; Tiles; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., Proceedings of the 33rd Midwest Symposium on
  • Conference_Location
    Calgary, Alta.
  • Print_ISBN
    0-7803-0081-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1990.140697
  • Filename
    140697