DocumentCode
2793090
Title
Testing of iterative logic arrays
Author
Bhatia, Sandeep ; Albicki, Alexander
Author_Institution
Dept. of Electr. Eng., Rochester Univ., NY, USA
fYear
1990
fDate
12-14 Aug 1990
Firstpage
243
Abstract
A method is presented to identify test vectors for iterative logic arrays (ILA). An ILA consists of several identical cells connected together in a regular configuration. The circuit regularity is exploited to regenerate the test vectors, applied at the boundary cells, within the array and thus propagate the test vectors to the entire array. This facilitates simultaneous testing of the entire circuit. The method covers a wide range of regular array structures like adders, multipliers, and interconnection networks
Keywords
adders; logic arrays; logic testing; multiplying circuits; adders; boundary cells; circuit regularity; interconnection networks; iterative logic arrays; multipliers; test vectors; Adders; Circuit faults; Circuit testing; Equations; Iterative methods; Logic arrays; Logic testing; Multiprocessor interconnection networks; Tiles; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1990., Proceedings of the 33rd Midwest Symposium on
Conference_Location
Calgary, Alta.
Print_ISBN
0-7803-0081-5
Type
conf
DOI
10.1109/MWSCAS.1990.140697
Filename
140697
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