Title :
Wavelength stabilization and mode selection of a GaSb-based semiconductor disk laser at 2 µm by using a volume Bragg grating
Author :
Scholle, K. ; Lamrini, S. ; Fuhrberg, P. ; Rattunde, M. ; Wagner, J.
Author_Institution :
LISA laser products OHG, Katlenburg, Germany
Abstract :
Optically pumped semiconductor disk laser (OPSDL) based on the (AlGaIn)(AsSb) unify preferable features from semiconductor and solid state lasers, therefore they can be an excellent source in this wavelength region. To realize this with standard laser setups is quite difficult. For the first time on an OPSDL system in the 2 mum wavelength region with a volume Bragg grating (VBG) as output coupler and for wavelength selection and stabilization is reported. The approximately 10 mum thick monolithically grown OPSDL device structure comprised a high quality AlAsSb/GaSb distributed Bragg reflector with reflectivity >99.5%. For the laser experiments square peaces of 3x3 mm were used. To improve the heat removal from the active region a 0.4 mm thick SiC heat spreader was attached to the surface by liquid capillary bonding.
Keywords :
Bragg gratings; III-V semiconductors; aluminium compounds; arsenic compounds; distributed Bragg reflector lasers; gallium compounds; laser stability; optical pumping; semiconductor lasers; silicon compounds; wide band gap semiconductors; AlAsSb-GaSb; SiC; distributed Bragg reflector reflectivity; heat removal; liquid capillary bonding; monolithically grown OPSDL device structure; optically pumped semiconductor disk laser; output coupler; size 0.4 mm; size 10 mum; volume Bragg grating; wavelength 2 mum; wavelength mode selection; wavelength stabilization; Bragg gratings; Distributed Bragg reflectors; Gas lasers; Laser excitation; Laser modes; Laser stability; Optical pumping; Pump lasers; Semiconductor lasers; Solid lasers;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5192463