DocumentCode :
2793340
Title :
Advanced high current, high reliable IGBT module with improved multi-chip structure
Author :
Saito, R. ; Koike, Y. ; Tanaka, A. ; Kushima, T. ; Shimizu, H. ; Nonoyama, S.
Author_Institution :
Res. Lab., Hitachi Ltd., Ibaraki, Japan
fYear :
1999
fDate :
1999
Firstpage :
109
Lastpage :
112
Abstract :
Advanced IGBT module technology to realize high reliability and high current capability was presented. The 60,000 cycles long term power cycle capability of the low thermal expansion base module was demonstrated. A stress release tall mounting structure and a ceramic metal pull back structure were shown to be essential for high thermal cycle capability. A multi-end main terminal with multichip substrate and high resistivity sense emitter terminal technology was applied to realize high current capability and uniformity in the large high power module
Keywords :
ceramic packaging; insulated gate bipolar transistors; multichip modules; power bipolar transistors; semiconductor device reliability; thermal expansion; thermal stresses; IGBT module technology; ceramic metal pull back structure; current capability; current uniformity; high current IGBT module; high reliability IGBT module; low thermal expansion base module; multi-chip structure; multi-end main terminal; multichip substrate; power cycle capability; reliability; resistivity; sense emitter terminal technology; stress release tall mounting structure; thermal cycle capability; Artificial intelligence; Bonding; Fasteners; Fatigue; Heat sinks; Insulated gate bipolar transistors; Life estimation; Testing; Thermal stresses; Water heating;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on
Conference_Location :
Toronto, Ont.
ISSN :
1063-6854
Print_ISBN :
0-7803-5290-4
Type :
conf
DOI :
10.1109/ISPSD.1999.764074
Filename :
764074
Link To Document :
بازگشت