DocumentCode :
2793456
Title :
GaN-on-Si technology, a new approach for advanced devices in energy and communications
Author :
Chung, J.W. ; Ryu, K. ; Lu, B. ; Palacios, Tomás
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Massachusetts Inst. of Technol., Cambridge, MA, USA
fYear :
2010
fDate :
14-16 Sept. 2010
Firstpage :
52
Lastpage :
56
Abstract :
The Si substrate of GaN-on-Si wafers offers new opportunities to increase the functionality and performance of nitride-based devices. This paper will review three examples of these new devices/systems. First, GaN-on-Si substrates allow the on-chip heterogeneous integration of GaN and Si electronics. Second, the easy removal of the Si substrate through dry or wet etching gives access to the N-face of the GaN layer, and all the new device structures that this orientation enables. Finally, the use of Si substrates for the growth of GaN high voltage switches makes the cost of these devices competitive with Si devices, and the total or partial etch of Si brings a new degree of freedom to increase the breakdown and performance of GaN transistors.
Keywords :
III-V semiconductors; etching; gallium arsenide; GaN; GaN electronics; GaN transistor; GaN-on-Si substrates; GaN-on-Si wafers; Si; Si electronics; dry etching; nitride-based devices; on-chip heterogeneous integration; wet etching; Aluminum gallium nitride; Gallium nitride; HEMTs; MODFETs; Performance evaluation; Silicon; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2010 Proceedings of the European
Conference_Location :
Sevilla
ISSN :
1930-8876
Print_ISBN :
978-1-4244-6658-0
Type :
conf
DOI :
10.1109/ESSDERC.2010.5617745
Filename :
5617745
Link To Document :
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