• DocumentCode
    2793556
  • Title

    The dielectric properties on Pb-complex perovskite with low firing temperature

  • Author

    Chae, Hong-In ; Lim, Kee-Joe ; Lee, Jeong-Goo ; Lee, Sang-Seok ; Choy, Tae-Goo

  • Author_Institution
    Dept. of Electr. Eng., Chungbuk Nat. Univ., Seoul, South Korea
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    480
  • Abstract
    The authors propose new dielectric compositions and their preparation method. The dielectric compositions comprise lead magnesium niobate, lead zinc niobate, and lead lithium tungstate (PMN-PZN-PLW). They can be fired at a temperature between 1000 and 1050°C, and can thus be used with high-silver-content electrodes in manufacturing MLCCs (multilayer ceramic capacitors). The dielectric constant peak is shifted near room temperature with increasing PMN content, and the optimum composition is 0.77PMN-0.27PZN-0.03PLW with 1 wt.% excess PbO addition. These compositions have dielectric constants in the range of 8000~12000, the dissipation factor is less than 2%, and the temperature coefficient of capacitance is +5~-47%. These dielectric properties are particularly suitable for Z5U MLCC
  • Keywords
    capacitors; dielectric materials; dielectric properties of solids; lead compounds; magnesium compounds; permittivity; sintering; 1000 to 1050 degC; MLC capacitor manufacture; PMN-PbZnO3NbO3-PbLiO3WO3; Pb-complex perovskite; PbMgO3NbO3-PbZnO3NbO3-PbLiO3WO3; PbO; Z5U; dielectric compositions; dielectric constant; dielectric properties; dissipation factor; low firing temperature; multilayer ceramic capacitors; temperature coefficient of capacitance; Dielectric constant; Electrodes; Firing; Lead; Lithium; Magnesium; Manufacturing; Niobium compounds; Temperature; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172102
  • Filename
    172102