Title :
An approach to the spacer design of HVDC SF6 gas insulated equipment
Author :
Akimov, V.V. ; Varivodov, V.N. ; Volpov, E.K.
Author_Institution :
All-Union Electrotech. Inst., Moscow, USSR
Abstract :
Some of design and technological measures employed to increase SF 6 insulation reliability are discussed. It is pointed out that the insulation characteristics of SF6 HVDC equipment markedly differ from those of analogous HVAC equipment. The minimum discharge electric stress values measured with long-term voltage application and reduced gas pressure are approximately equal to 20 MV/m×MPa, which is substantially lower than values measured with smooth voltage rise; a decreased electric strength on the insulator surface is directly associated with transient processes in the insulation, caused by free surface charge distortion. The generalization of the calculated and experimental data concerning the electric characteristics of CEI/SF6 DC insulation has enabled the formulation of a general approach to choosing proper HVDC SF6 equipment spacer configurations. This approach is based on the criterion of spacer-accumulated surface charge minimization. As a technological measure the abrasive treatment of the insulation surface as well as using external shielding electrodes with dielectric coating is recommended
Keywords :
DC power transmission; electric strength; gaseous insulation; high-voltage engineering; reliability; sulphur compounds; HVDC equipment; SF6 gas insulated equipment; SF6 insulation reliability; abrasive treatment; cast epoxy insulation; dielectric coating; electric characteristics; electric strength; external shielding electrodes; free surface charge distortion; insulator surface; long-term voltage application; minimum discharge electric stress; spacer design; spacer-accumulated surface charge minimization; transient processes; Charge measurement; Current measurement; Dielectrics and electrical insulation; Distortion measurement; Electric variables measurement; HVDC transmission; Pressure measurement; Space technology; Stress measurement; Voltage measurement;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-87942-568-7
DOI :
10.1109/ICPADM.1991.172113