Title :
IP-XACT based system level mutation testing
Author :
Xie, Tao ; Mueller, Wolfgang ; Letombe, Florian
Author_Institution :
C-Lab., Univ. of Paderborn, Paderborn, Germany
Abstract :
Mutation-testing has been considered as an important coverage metric to measure the quality of simulation-based verification and validation processes [1, 2, 3]. On the other hand, IP-XACT has evolved to the IEEE standard for IP reuse and IP-based System-on-Chip (SoC) integration, which covers both RTL and TLM. In this paper, we present our effort to enable the mutation-based simulation coverage metric for system level IP integration with IP-XACT. Two major ingredients are required for this extension. First, as IP-XACT system designs are XML files, which are not originally for execution, we need an execution/simulation engine for IP-XACT designs. For this, we created a code generator that generates SystemC models from IP-XACT XML designs, such that we can simulate and test an IP-XACT design. Second, we define the mutation operators on IP-XACT schema, which is the model of errors that we can inject into IP-XACT designs during mutation testing. With IP-XACT, the mutation maintains a focus on the integration and configuration of components. We implemented the code generator and mutation operators in an Eclipsed-based IP-XACT editor with the help of Eclipse Modeling Framework. Then several experiments were conducted on a TLM library for CoreConnect SoC modeling. From the results, we can see that the defined IP-XACT mutation serves an effective qualification for simulation tests, in terms of its ability to reveal the weakness of the tests.
Keywords :
XML; integrated circuit design; integrated circuit modelling; program testing; program verification; system-on-chip; CoreConnect SoC modeling; Eclipse Modeling Framework; Eclipsed-based IP-XACT editor; IEEE standard; IP reuse; IP-XACT XML designs; IP-XACT system designs; IP-XACT-based system level mutation testing; IP-based SoC integration; IP-based system-on-chip integration; RTL; SystemC models; TLM library; XML files; code generator; execution-simulation engine; mutation operators; mutation-based simulation coverage metric; simulation tests; simulation-based validation process; simulation-based verification process; system level IP integration; Engines; Generators; IP networks; Measurement; System-on-a-chip; Testing; XML; IP reuse; IP-XACT; SoC verification; mutation testing;
Conference_Titel :
High Level Design Validation and Test Workshop (HLDVT), 2011 IEEE International
Conference_Location :
Napa Valley, CA
Print_ISBN :
978-1-4577-1744-4
DOI :
10.1109/HLDVT.2011.6114167