• DocumentCode
    2793950
  • Title

    High performance extended drain MOSFETs (EDMOSFETs) with metal field plate

  • Author

    Lee, Mueng-Ryul ; Kwon, Oh-Kyong

  • Author_Institution
    Div. of Electron. & Electr. Eng., Hanyang Univ., Seoul, South Korea
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    249
  • Lastpage
    252
  • Abstract
    We propose a structure for extended drain MOSFETs (EDMOSFETs) with a metal field plate separated from the gate electrode instead of the polysilicon field plate in conventional LDMOSFETs. The specific on-resistance is improved by applying a higher voltage to the field plate than the gate voltage because of the enhanced conductivity modulation, and the breakdown voltage of 280 V is not changed by the field plate voltage. When a voltage of 50 V is applied to the field plate, the specific on-resistance of a 280 V EDMOSFET is 17.63 mΩcm2, which is lower than that of conventional LDMOSFETs by 11.8%. The performance of the EDMOSFETs is the best reported result in 280 V class lateral high voltage MOS devices
  • Keywords
    electric resistance; electrical conductivity; electrodes; power MOSFET; power integrated circuits; semiconductor device breakdown; 280 V; 50 V; EDMOSFETs; HVIC; LDMOSFETs; breakdown voltage; conductivity modulation; extended drain MOSFET structure; extended drain MOSFETs; field plate voltage; gate electrode; lateral high voltage MOS devices; metal field plate; polysilicon field plate; specific on-resistance; Breakdown voltage; Charge carrier density; Conductivity; Electric breakdown; Electrodes; Fabrication; Immune system; MOSFETs; Medical simulation; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-5290-4
  • Type

    conf

  • DOI
    10.1109/ISPSD.1999.764110
  • Filename
    764110