The behavior of digital circuits under substrate noise in a mixed-signal smart-power environment

Author

Secareanu, Radu M. ; Kourtev, Ivan S. ; Becerra, Juan ; Watrobski, Thomas E. ; Morton, Christopher ; Staub, William ; Tellier, Thomas ; Friedman, Eby G.

Author_Institution

Dept. of Electr. Eng., Rochester Univ., NY, USA

fYear

1999

fDate

1999

Firstpage

253

Lastpage

256

Abstract

The behavior of digital circuits in a noisy environment in mixed-signal smart-power systems is described in this paper. Several models and mechanisms explaining the process in which substrate noise affects on-chip digital circuits as well as the noise immunity behavior of digital circuits are presented and discussed. The models and mechanisms are demonstrated by simulations and by extensive test chip-based experimental data

Keywords

circuit simulation; digital integrated circuits; integrated circuit modelling; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; power integrated circuits; digital circuit behaviour; digital circuits; mixed-signal smart-power environment; mixed-signal smart-power systems; models; noise immunity behaviour; on-chip digital circuits; process mechanisms; simulations; substrate noise; test chip; Circuit noise; Digital circuits; Driver circuits; Logic; Noise generators; Power generation; Semiconductor device noise; Substrates; Voltage; Working environment noise;

fLanguage

English

Publisher

ieee

Conference_Titel

Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on

Conference_Location

Toronto, Ont.

ISSN

1063-6854

Print_ISBN

0-7803-5290-4

Type

conf

DOI

10.1109/ISPSD.1999.764111

Filename

764111