DocumentCode :
2794047
Title :
Forward drop-leakage current tradeoff analysis of a junction barrier Schottky (JBS) rectifier
Author :
Hossain, Zia ; Cartmell, Don ; Dashney, Gary
Author_Institution :
Semicond. Products Sector, Motorola Inc., Phoenix, AZ, USA
fYear :
1999
fDate :
1999
Firstpage :
265
Lastpage :
268
Abstract :
This paper demonstrates the trade-off relationship of forward voltage drop (VF) and leakage current (IR) of a junction-barrier-controlled Schottky (JBS) rectifier as compared to a conventional Schottky barrier rectifier (SBR). The JBS rectifier has been considered as a potential candidate for achieving low forward voltage drop (VF) while maintaining reasonable reverse characteristics for over a decade. However, to date, there is no definitive VF-IR trade-off study of the JBS rectifier as compared to SBR at rated operating conditions. Our experimental results show that JBS has a VF-IR trade-off advantage over SBR at low current density for an optimized process and device geometry; and almost no improvement is found at a current density used typically for a power Schottky rectifier
Keywords :
Schottky diodes; current density; electric potential; leakage currents; optimisation; power semiconductor diodes; semiconductor device measurement; solid-state rectifiers; JBS rectifier; Schottky barrier rectifier; current density; forward voltage drop; forward voltage drop-leakage current trade-off analysis; junction barrier Schottky rectifier; junction-barrier-controlled Schottky rectifier; leakage current; optimized device geometry; optimized process; power Schottky rectifier; rated operating conditions; reverse characteristics; trade-off relationship; Current density; Geometry; Leakage current; Low voltage; Nickel; Power supplies; Rectifiers; Schottky barriers; Semiconductor devices; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on
Conference_Location :
Toronto, Ont.
ISSN :
1063-6854
Print_ISBN :
0-7803-5290-4
Type :
conf
DOI :
10.1109/ISPSD.1999.764114
Filename :
764114
Link To Document :
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