DocumentCode
2794280
Title
Electrical transport properties of Josephson junctions using polyimide Langmuir-Blodgett films
Author
Kubota, Tohru ; Iwamoto, Mitsumasa ; Sekine, Matsuo
Author_Institution
Tokyo Inst. of Technol., Japan
fYear
1991
fDate
8-12 Jul 1991
Firstpage
643
Abstract
The authors prepared high-quality ultrathin multilayered films of polyimide (PI) on base-(noble metal) electrodes by the Langmuir-Blodgett (LB) technique and then fabricated tunnel junctions with structures of Au/PI/Au and Au/PI/(Pb-Bi). They also fabricated Josephson junctions consisting of PI LB films sandwiched between Nb/Au and (Pb-Bi) superconducting electrodes. Subsequently, they examined the electrical transport properties of the junctions. It was found that the electrical transport current flowing through the PI LB layers is ruled by the tunneling theory of the Bardeen-Cooper-Schrieffer theory. The inelastic electron tunneling spectroscopy spectra of the junctions show that electron tunneling through PI LB films is elastic
Keywords
Langmuir-Blodgett films; metal-insulator-metal structures; polymer films; superconducting junction devices; superconductive tunnelling; Bardeen-Cooper-Schrieffer theory; Josephson junctions; elastic electron tunneling; electrical transport current; electrical transport properties; inelastic electron tunneling spectroscopy; polyimide Langmuir-Blodgett films; tunnel junctions; ultrathin multilayered films; Electrodes; Electrons; Gold; Josephson junctions; Niobium; Polyimides; Spectroscopy; Superconducting epitaxial layers; Superconducting films; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location
Tokyo
Print_ISBN
0-87942-568-7
Type
conf
DOI
10.1109/ICPADM.1991.172146
Filename
172146
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