• DocumentCode
    2794280
  • Title

    Electrical transport properties of Josephson junctions using polyimide Langmuir-Blodgett films

  • Author

    Kubota, Tohru ; Iwamoto, Mitsumasa ; Sekine, Matsuo

  • Author_Institution
    Tokyo Inst. of Technol., Japan
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    643
  • Abstract
    The authors prepared high-quality ultrathin multilayered films of polyimide (PI) on base-(noble metal) electrodes by the Langmuir-Blodgett (LB) technique and then fabricated tunnel junctions with structures of Au/PI/Au and Au/PI/(Pb-Bi). They also fabricated Josephson junctions consisting of PI LB films sandwiched between Nb/Au and (Pb-Bi) superconducting electrodes. Subsequently, they examined the electrical transport properties of the junctions. It was found that the electrical transport current flowing through the PI LB layers is ruled by the tunneling theory of the Bardeen-Cooper-Schrieffer theory. The inelastic electron tunneling spectroscopy spectra of the junctions show that electron tunneling through PI LB films is elastic
  • Keywords
    Langmuir-Blodgett films; metal-insulator-metal structures; polymer films; superconducting junction devices; superconductive tunnelling; Bardeen-Cooper-Schrieffer theory; Josephson junctions; elastic electron tunneling; electrical transport current; electrical transport properties; inelastic electron tunneling spectroscopy; polyimide Langmuir-Blodgett films; tunnel junctions; ultrathin multilayered films; Electrodes; Electrons; Gold; Josephson junctions; Niobium; Polyimides; Spectroscopy; Superconducting epitaxial layers; Superconducting films; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172146
  • Filename
    172146