Title :
A design of mixed-signal test controller based on boundary scan
Author :
Chen, Shengjian ; Wang, Mengmeng ; Xu, Lei ; Zhou, Yin
Author_Institution :
Dept. of Control Eng., Acad. of Armored Force Eng., Beijing, China
Abstract :
With the rapid development of microelectronics, it is difficult to test complicated integrated circuit for the traditional test methods. For this circs, JTAG puts forward a new kind of circuit test method - boundary scan technology. According to the IEEE1149.4, a boundary scan controller is designed by ATmega128 MCU and SN74ACT8990. Experiments show that the test controller can locate faults rapidly. The design of the boundary scan controller provides a basis for the further research of mixed electronic system BIT.
Keywords :
boundary scan testing; integrated circuit testing; microcontrollers; ATmega128 MCU; IEEE1149.4; JTAG; SN74ACT8990; boundary scan controller; boundary scan technology; integrated circuit testing; microelectronics; mixed-signal test controller; Circuit faults; Integrated circuit interconnections; Microcontrollers; Process control; Registers; Software; Testing; IEEE1149.4; boundary scan; test controller;
Conference_Titel :
Mechanic Automation and Control Engineering (MACE), 2011 Second International Conference on
Conference_Location :
Hohhot
Print_ISBN :
978-1-4244-9436-1
DOI :
10.1109/MACE.2011.5987086
