Title :
Silicon Bipolar Clock-Recovery, 1:16-Damultiplexer, and PRBS Generator/Error Detector ICs Operating up to /spl ges/ 10 Gbit/s
Author_Institution :
Ruhr-Universitat Bochum, Germany
Keywords :
Circuit testing; Clocks; Detectors; Frequency; Integrated circuit testing; Jitter; Latches; Master-slave; Multiplexing; Silicon;
Conference_Titel :
Flat Panel Display Technology/Technologies for a Global Information Infrastructure/ICs for New Age Lightwave Communications/RF Optoelectronics, 1995 Digest of the LEOS Summer Topical Meetings
Conference_Location :
Keystone, CO, USA
Print_ISBN :
0-7803-2448-X
DOI :
10.1109/LEOSST.1995.764135