DocumentCode :
2794628
Title :
Dielectric life test with cut-tail sample in groups and estimation of distribution parameters
Author :
Tan, K.X. ; Kärner, H. ; Kodoll, W.
Author_Institution :
Tsinghua Univ., Beijing, China
fYear :
1991
fDate :
8-12 Jul 1991
Firstpage :
715
Abstract :
In many cases, the lifetimes of solid dielectrics are distributed as the exponential distribution, and the lifetime characteristics of different materials could be statistically evaluated by distribution parameters. The cut-tail sample is used to reduce the test time and specimens are divided into groups to make the experiments available. A method of estimation of the exponential distribution parameters is developed for the cut-tail sample and specimens in groups. Simulation experiments are completed with the aid of the Monte Carlo method to investigate some important aspects such as the necessary number of specimens, errors of obtained statistical characteristic values, test times, and expense for specimens. Practical experiments have supported the results obtained from simulation experiments
Keywords :
Monte Carlo methods; ageing; life testing; materials testing; organic insulating materials; Monte Carlo method; cut-tail sample; dielectric life tests; errors; expense for specimens; exponential distribution; lifetime characteristics; number of specimens; simulation experiments; solid dielectrics; statistical characteristic values; test times; Breakdown voltage; Conductivity; Dielectric materials; Exponential distribution; Life estimation; Life testing; Parameter estimation; Partial discharges; Performance evaluation; Solids;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-87942-568-7
Type :
conf
DOI :
10.1109/ICPADM.1991.172165
Filename :
172165
Link To Document :
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