Title :
Scanning photocurrent microscopy in semiconducting carbon nanotube transistors
Author :
Ahn, Yeonghwan ; Park, Jiwoong
Author_Institution :
Division of Energy Systems Research, Ajou University, Suwon 443-749, Korea
Abstract :
Scanning photocurrent measurements are demonstrated in individual carbon nanotube field effect transistors. Photocurrent images in conjunction with the electrical conductance measurement elucidate the properties of metal-CNT interfaces, especially the electron band alignment at the contact.
Keywords :
Atomic force microscopy; CNTFETs; Carbon nanotubes; Electric variables measurement; Electrodes; FETs; Laser beams; Optical microscopy; Photoconductivity; Semiconductivity;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/QELS.2007.4431777
