Title :
Multi-path properties in microwave fading
Author :
Ikegami, Fumio ; Nomura, Tadahiro
Author_Institution :
Nippon Telegraph and Telephone Public Corporation, Japan
Keywords :
Ducts; Earth; Fading; Frequency measurement; Interference; Meteorology; Microwave propagation; Reflection; Shape measurement; Testing;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1965
DOI :
10.1109/APS.1965.1150243
