• DocumentCode
    2795188
  • Title

    Charging and discharging phenomena in oxides, electrical and mechanical applications

  • Author

    Gressus, C. Le ; Blaise, G.

  • Author_Institution
    CEA-DSM-CENS, Gif sur Yvette, France
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    812
  • Abstract
    Research was conducted to investigate (1) the origin of the correlation which exists between the charging of insulators and their properties (breakdown, fracture toughness, wear, etc.); (2) the origin of the analogy which exists between electric properties and mechanical properties of insulators; and (3) the origin of electron and photoemissions which occur prior to or at the instant of the catastrophe (breakdown, fracture). A theoretical approach to charging and discharging phenomena has made it possible to develop an experimental method giving characteristic dielectric parameters: permittivity, distribution of defects, and energy which can be dissipated inside the insulator without initiating a catastrophe. This method was used to correlate these parameters with the breakdown voltage of oxides and of polymers, and with mechanical properties of ceramics. New high performance materials were prepared
  • Keywords
    electric breakdown of solids; electron field emission; fracture toughness; permittivity; photoemission; wear; breakdown; breakdown voltage; charging; dielectric parameters; discharging phenomena; electron emissions; fracture toughness; insulators; mechanical applications; oxides; photoemissions; polymers; wear; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Electron traps; Mechanical factors; Permittivity; Piezoelectric polarization; Potential well; Space charge; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172191
  • Filename
    172191