DocumentCode
2795334
Title
Disk drive vintage and its effect on reliability
Author
Shah, Sandeep ; Elerath, Jon G.
Author_Institution
Network Appliance Inc., Sunnyvale, CA, USA
fYear
2004
fDate
26-29 Jan. 2004
Firstpage
163
Lastpage
167
Abstract
Field failure data for 3 disk drive families from 3 drive manufacturers is analyzed. The analyses illustrate the effects of design and manufacturing process improvements implemented throughout the drive´s production life on the reliability of disk drives. Also, the resultant effect of convolution of different shipment volumes and different vintage drives reliability is studied. Two drive families show distinct reliability differences between drive vintages. The newer vintage drives are more reliable than the older vintage drives. One interesting observation is the ratio of average failure rate during the first three or four months of production to the average failure rate later in time when failure rate has stabilized. This ratio is observed to be between 2 and 3. One drive family, on the other hand, showed almost no difference in the reliability between vintages because of a dominant failure mechanism that was unaffected by most of the design and manufacturing process changes implemented. Also, if the shipment volumes are high in the beginning period of the drive shipments the overall reliability of the field population may be lower due to a high contribution of the early vintage drives with higher failure rates.
Keywords
design for manufacture; disc drives; failure analysis; manufacturing processes; reliability; Weibull analysis; disk drive vintage reliability; dominant failure mechanism; drive manufacturers; drive production life; failure rate; hazard rate; manufacturing date; manufacturing process; shipment volumes; Assembly; Disk drives; Failure analysis; Hazards; Home appliances; Magnetic heads; Magnetic separation; Manufacturing processes; Process design; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability, 2004 Annual Symposium - RAMS
Print_ISBN
0-7803-8215-3
Type
conf
DOI
10.1109/RAMS.2004.1285441
Filename
1285441
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