• DocumentCode
    2795350
  • Title

    High-field conduction and interfacial phenomena in a thin dielectric liquid layer

  • Author

    Brosseau, C.

  • Author_Institution
    Lab. de Spectrometrie Phys., Univ. Joseph Fourier, St. Martin d´Heres
  • fYear
    1991
  • fDate
    8-12 Jul 1991
  • Firstpage
    848
  • Abstract
    The author reports experimental work on the AC conduction phenomena of a thin dielectric liquid (capacitor impregnant) layer at high electric field for several interfacial situations. The features revealed by these experiments show a strong dependence of the liquid electric losses (at a frequency of 50 Hz) according to whether the liquid is in contact with a metallic or a polymer interface. An attempt is made to elucidate these measurements in terms of the existing theories of ionic conduction in non-polar liquids: it turns out that charge-carrier injection in the neighbourhood of the interface is the dominant contribution of the high-field liquid conductivity. A theoretical evaluation based on the unipolar injection model is given in agreement with the experimental results obtained in the different configurations
  • Keywords
    dielectric losses; dielectric properties of liquids and solutions; electrical conductivity of liquids; high field effects; interface phenomena; liquid films; 50 Hz; AC conduction; capacitor impregnant; charge-carrier injection; high electric field; high field conduction; interfacial phenomena; ionic conduction; liquid electric losses; metallic interface; nonpolar liquids; polymer interface; thin dielectric liquid layer; unipolar injection model; Capacitors; Current measurement; Dielectric liquids; Dielectric loss measurement; Electric fields; Electrochemical impedance spectroscopy; Electrodes; Frequency measurement; Loss measurement; Polymer films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
  • Conference_Location
    Tokyo
  • Print_ISBN
    0-87942-568-7
  • Type

    conf

  • DOI
    10.1109/ICPADM.1991.172200
  • Filename
    172200