DocumentCode :
2795464
Title :
Negative refraction in mid-infrared semiconductor metamaterials
Author :
Hoffman, Anthony J. ; Alekseyev, Leonid ; Narimanov, Evgenii E. ; Gmachl, Claire ; Sivco, Deborah L.
Author_Institution :
Department of Electrical Engineering, Princeton University, NJ 08544, USA
fYear :
2007
fDate :
6-11 May 2007
Firstpage :
1
Lastpage :
2
Abstract :
Semiconductor metamaterials consisting of n+-GaInAs/i-AlInAs heterostructures that support negative index modes in the mid-infrared are reported. We demonstrate negative refraction in these metamaterials for wavelengths from 9¿15 ¿m over a wide range of incidence angles.
Keywords :
Dielectric materials; Magnetic materials; Metamaterials; Optical imaging; Optical materials; Optical refraction; Optical resonators; Optical variables control; Tellurium; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
Type :
conf
DOI :
10.1109/QELS.2007.4431825
Filename :
4431825
Link To Document :
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