• DocumentCode
    2795628
  • Title

    Analog atpg: a response to users´needs

  • Author

    Bedrosian, Samuel D.

  • Author_Institution
    University of Pennsylvania
  • fYear
    1978
  • fDate
    1978
  • Firstpage
    41
  • Lastpage
    43
  • Keywords
    Automatic test pattern generation; Circuit testing; Fault diagnosis; Learning automata; Maintenance; Marine vehicles; Military computing; Reliability engineering; Systems engineering and theory; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '78. International Automatic Testing Conference
  • Type

    conf

  • DOI
    10.1109/AUTEST.1978.764233
  • Filename
    764233
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2795628