• DocumentCode
    2795658
  • Title

    Reliability Analysis for Power Electronics Modules

  • Author

    Bailey, C. ; Tilford, T. ; Lu, H.

  • Author_Institution
    Greenwich Univ., London
  • fYear
    2007
  • fDate
    9-13 May 2007
  • Firstpage
    12
  • Lastpage
    17
  • Abstract
    This paper discusses the reliability of power electronics modules. The approach taken combines numerical modeling techniques with experimentation and accelerated testing to identify failure modes and mechanisms for the power module structure and most importantly the root cause of a potential failure. The paper details results for two types of failure (i) wire bond fatigue and (ii) substrate delamination. Finite element method modeling techniques have been used to predict the stress distribution within the module structures. A response surface optimisation approach has been employed to enable the optimal design and parameter sensitivity to be determined. The response surface is used by a Monte Carlo method to determine the effects of uncertainty in the design.
  • Keywords
    Monte Carlo methods; delamination; fatigue; finite element analysis; integrated circuit bonding; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; lead bonding; optimisation; power integrated circuits; Monte Carlo method; accelerated testing; design uncertainty; finite element method modeling techniques; optimal design; parameter sensitivity; power electronics modules; power module structure; reliability analysis; stress distribution; substrate delamination; surface optimisation approach; wire bond fatigue; Bonding; Delamination; Fatigue; Finite element methods; Life estimation; Multichip modules; Numerical models; Power electronics; Response surface methodology; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology, 30th International Spring Seminar on
  • Conference_Location
    Cluj-Napoca
  • Print_ISBN
    987-1-4244-1218-1
  • Electronic_ISBN
    987-1-4244-1218-1
  • Type

    conf

  • DOI
    10.1109/ISSE.2007.4432813
  • Filename
    4432813