DocumentCode :
2795658
Title :
Reliability Analysis for Power Electronics Modules
Author :
Bailey, C. ; Tilford, T. ; Lu, H.
Author_Institution :
Greenwich Univ., London
fYear :
2007
fDate :
9-13 May 2007
Firstpage :
12
Lastpage :
17
Abstract :
This paper discusses the reliability of power electronics modules. The approach taken combines numerical modeling techniques with experimentation and accelerated testing to identify failure modes and mechanisms for the power module structure and most importantly the root cause of a potential failure. The paper details results for two types of failure (i) wire bond fatigue and (ii) substrate delamination. Finite element method modeling techniques have been used to predict the stress distribution within the module structures. A response surface optimisation approach has been employed to enable the optimal design and parameter sensitivity to be determined. The response surface is used by a Monte Carlo method to determine the effects of uncertainty in the design.
Keywords :
Monte Carlo methods; delamination; fatigue; finite element analysis; integrated circuit bonding; integrated circuit modelling; integrated circuit reliability; integrated circuit testing; lead bonding; optimisation; power integrated circuits; Monte Carlo method; accelerated testing; design uncertainty; finite element method modeling techniques; optimal design; parameter sensitivity; power electronics modules; power module structure; reliability analysis; stress distribution; substrate delamination; surface optimisation approach; wire bond fatigue; Bonding; Delamination; Fatigue; Finite element methods; Life estimation; Multichip modules; Numerical models; Power electronics; Response surface methodology; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology, 30th International Spring Seminar on
Conference_Location :
Cluj-Napoca
Print_ISBN :
987-1-4244-1218-1
Electronic_ISBN :
987-1-4244-1218-1
Type :
conf
DOI :
10.1109/ISSE.2007.4432813
Filename :
4432813
Link To Document :
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